Description

The Keyence VK-X3000 is a high-resolution optical profilometer designed for non-contact 3D surface characterization across a wide range of materials. It combines laser scanning confocal microscopy with white light interferometry to accurately measure surface roughness, step height, film thickness, and overall topography. The system performs well on challenging samples, including those with varying reflectivity, steep features, or mixed materials. Automated measurement routines and intuitive software enable fast, repeatable data collection with minimal user setup. Its large dynamic range allows for both nanoscale roughness measurements and millimeter-scale feature profiling in a single platform.

KeyenceVKX3000